Papers Resources Ultrasound Acoustics, Ultrasound and Vibration

• - E. G. Nesvijski Center of Technology, Federal University of Santa Maria Campus Universitario, Santa Maria, RS 97110-970, Brazil (NDT-net)
  
• - Dr. Werner Roye,Udo Schlengermann, KRAUTKRÄMER GmbH & Co. oHG, D - Hürth (NDT-net)
  
• - Cho, Younho Department of Mechanical Engineering, Inje Univ., The Republic of Korea Park, Jung-Chul
  
• - Harri Jeskanen, Pentti Kauppinen, Jorma Pitkänen and Seppo Tähtinen VTT Manufacturing Technology FINLAND (NDT-net
  
• - By Kenneth A. Fowler, Gerry M. Elfbaum, Karen A. Smith and Thomas J. Nelligan (Panametrics)
  
• - P.Prokhorenko, A.Baev, G.Konovalov, A.Mayorov (NDT-net)
  
• - H. Wüstenberg, A. Erhard, G. Schenk (NDT-net)
  
• - Zheng Kaisheng,Chen Yucheng Baoji Non-ferrous Metals Works, Baoji 721014 Peng Yingqiu
  
• - J. Neurophysiol. -- Abstracts: Oohashi et al. 83 (6): 3548
  
• - Shao-he Song, Xin Zhang, Jin-qiang Hu; Gansu Electric Powere Test & Research Institute, China (NDT-net)
  
• - Jan O. Strycek and Hanspeter Loertscher (ndt.net)
  
• - Yoshio Udagawa, Imaging Supersonic Laboratories Co.,Ltd. (NDT-net).
  
• - Andrews, D.R., Instrumentation Innovation Ltd , Church Farm Barn, Horse Ware, Over, Cambridge CB4 5NX, GB.
  
• - Robert A. Day (NDT-net)
  
• - (ndt.net)
  
• - A. S. Bonnet-Ben Dhia.
  
• - E.A.Ginzel & R.K.Ginzel (ndt.net)
  
• - Nicolas Felix (VERMON), Dominique Certon, Frederic Patat and Marc Lethiecq (GIP Ultrasons / LUSSI),The e-Journal of Nondestructive Testing & Ultrasonics - Issue Vol. 5 No. 9 - September 2000
  
• - U. Netzelmann, H. Reiter, Y. Shi, J. Wang and M. Maisl (ndt.net)
  
• - T. Stepinski, P. Wu, E. Martinez * In collaboration with SKB (Swedish Nuclear Fuel and Waste Management Co) - NDT-net.
  
• - Theory and Modeling (J. Fagerholm, A. T. Friberg, J. Koskela, T. Makkonen and M. M. Salomaa)
  
• - by Shaun Lawson
  
• - Jose P. Panakkal, Advanced Fuel Fabrication Facility, Bhabha Atomic Research Centre, Tarapur, India 401 502 (ndt.net)
  
• - A properly designed interface circuit plays a key role in various piezo film applications. As the applications of piezo film spans from toys to military sensors, interfacing to electronics is application dependent. (AMP)
  
• - H.Wüstenberg, A.Erhard (NDT-net)
  
• - Christopher Francis Cheers M.A.
  
• - ndt.net
  
• - U. Schlengermann, W. Hansen, Krautkrämer GmbH & Co. (ndt.net)
  
• - M. Schickert (Martin.Schickert@mfpa.de), Materialforschungs- und prüfanstalt (MFPA) at HAB, Weimar (D)
  
• - V.N.Belyi, N.S.Kazak V.K.Pavlenko, A.G.Mashchenko and F.M.Severin (NDT-net)
  
• - Optel (PL)
  
• - Mahesh C. Bhardwaj Ultran Laboratories, Inc (NDT-net)
  
• - P.Wilcox, M.Lowe, P.Cawley: Department of Mechanical Engineering, Imperial College; London (NDT-net)
  
• - Wieslaw Bicz, Zbigniew Gumienny, Dariusz Kosz, Mieczyslaw Pluta (Optel (PL).
  
• - by Jan O. Strycek, Willem A. Grandia, and Hanspeter Loertscher (NDT-net)
  
• - H. Wüstenberg, A. Erhard, G. Schenk BAM - Berlin (NDT-net)
  
• - Chiaki MIYASAKA, and Bernhard R. TITTMANN Department of Engineering Science & Mechanics The Pennsylvania State University
  
• - Yoseph Bar-Cohen, Tianji Xue and Shyh-Shiuh Lih (NDTnet)
  
• - G.L. Wojcik, D.K. Vaughan, N.N. Abboud, J. Mould Jr. Weidlinger Associates Inc.
  
• - Y. Udagawa Imaging Supersonic Laboratories Co.,Ltd. (NDT-net)
  
• - Joe Buckley, Sonatest Plc (NDT-net)
  
• - Yasutoshi Sasaki and Kosei Ando Faculty of Agricultural Sciences, Nagoya University Nagoya 464-8601, Japan (NDT-net)
  
• - Hans-Jürgen Bäthmann, Klaus Grumbach, Dr. Jens Schröder, Hans Siegel (NDT-net)
  
• - ndt.net
  
• - Technical Note by NDT Systems, Huntington Beach, CA, USA (NDT-net)
  
• - (Manika Prasad's page)
  
• - S. Mahaut, O. Roy and S. Chatillon, Commissariat à l'Energie Atomique, CEA/CEREM, CE Saclay France (NDT-net)
  
• - H.H.J. Huynen, F.H. Dijkstra, T. Bouma, Röntgen Technische Dienst bv, Rotterdam, The Netherlands H. Wüstenberg
  
• - David A. Stubbs and Rollie E. Dutton, (JOM - a publication of The Minerals, Metals & Materials Society)
  
• - Jeongguk Kim and Peter K. Liaw (JOM)
  
• - Pentti Kauppinen, Harri Jeskanen and Jorma Pitkänen VTT Manufacturing Technology FINLAND (NDT-net)
  
• - Nesvijski E. G. Center of Technology, UFSM, Santa Maria, RS, Brazil (NDT-net)
  
• - Paper by D. R. Jackson and K. L. Williams, Applied Physics Laboratory, University of Washington, Seattle, WA.
  
• - M. Lach, M. Platte, A. Ries (NDTnet)
  
• - Robert A. Day examines the wisdom of neglecting periodic calibration and maintenance for periods of years as has occurred at some institutions.
  
  

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